Data-Driven Battery State of Health Estimation Based on Random Partial Charging DataShow others and affiliations
2022 (English)In: IEEE transactions on power electronics, ISSN 0885-8993, E-ISSN 1941-0107, Vol. 37, no 5, p. 5021-5031Article in journal (Refereed) Published
Abstract [en]
The rapid development of battery technology has promoted the deployment of electric vehicles (EVs). To ensure the healthy and sustainable development of EVs, it is urgent to solve the problems of battery safety monitoring, residual value assessment, and predictive maintenance, which heavily depends on the accurate state-of-health (SOH) estimation of batteries. However, many published methods are unsuitable for actual vehicle conditions. To this end, a data-driven method based on the random partial charging process and sparse Gaussian process regression (GPR) is proposed in this article. First, the random capacity increment sequences (oQ) at different voltage segments are extracted from the partial charging process. The average value and standard deviation of oQ are used as features to indicate battery health. Second, correlation analysis is conducted for three types of batteries, and high correlations between the features and battery SOH are verified at different temperatures and discharging current rates. Third, by using the proposed features as inputs, sparse GPR models are constructed to estimate the SOH. Compared with other data-driven methods, the sparse GPR has the highest estimation accuracy, and its average maximum absolute errors are only 2.88%, 2.52%, and 1.51% for three different types of batteries, respectively.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2022. Vol. 37, no 5, p. 5021-5031
Keywords [en]
Batteries, Estimation, Feature extraction, Voltage, Discharges (electric), Degradation, Aging, Capacity increment, lithium-ion battery, random charging segment, sparse Gaussian process, state-of-health
National Category
Other Chemical Engineering Control Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-307771DOI: 10.1109/TPEL.2021.3134701ISI: 000745538400020Scopus ID: 2-s2.0-85121836575OAI: oai:DiVA.org:kth-307771DiVA, id: diva2:1635629
Note
QC 20220207
2022-02-072022-02-072022-06-25Bibliographically approved