Sensitivity Analysis for Deep Learning: Ranking Hyper-parameter Influence
2021 (English)In: 2021 Ieee 33Rd International Conference On Tools With Artificial Intelligence (Ictai 2021), Institute of Electrical and Electronics Engineers (IEEE) , 2021, p. 512-516Conference paper, Published paper (Refereed)
Abstract [en]
We present a novel approach to rank Deep Learning (DL) hyper-parameters through the application of Sensitivity Analysis (SA). DL hyper-parameter tuning is crucial to model accuracy however, choosing optimal values for each parameter is time and resource-intensive. SA provides a quantitative measure by which hyper-parameters can be ranked in terms of contribution to model accuracy. Learning rate decay was ranked highest, with model performance being sensitive to this parameter regardless of architecture or dataset. The influence of a model's initial learning rate was proven to be low, contrary to the literature. Additionally, the importance of a parameter is closely linked to model architecture. Shallower models showed susceptibility to hyper-parameters affecting the stochasticity of the learning process whereas deeper models showed sensitivity to hyper-parameters affecting the convergence speed. Furthermore, the complexity of the dataset can affect the margin of separation between the sensitivity measures of the most and the least influential parameters, making the most influential hyper-parameter an ideal candidate for tuning compared to the other parameters.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2021. p. 512-516
Series
Proceedings-International Conference on Tools With Artificial Intelligence, ISSN 1082-3409
Keywords [en]
Sensitivity Analysis, Deep Learning, Hyper-parameter Tuning, Hyper-parameter rank, Hyper-parameter Influence
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:kth:diva-309319DOI: 10.1109/ICTAI52525.2021.00083ISI: 000747482300075Scopus ID: 2-s2.0-85123932953OAI: oai:DiVA.org:kth-309319DiVA, id: diva2:1641530
Conference
IEEE 33rd International Conference on Tools with Artificial Intelligence (ICTAI), NOV 01-03, 2021, ELECTR NETWORK, Washington, DC, USA
Note
QC 20220302
Part of proceedings ISBN: 978-1-6654-0898-1
2022-03-022022-03-022022-06-25Bibliographically approved