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A Review on Recent Advances in Vision-based Defect Recognition towards Industrial Intelligence
State Key Laboratory of Digital Manufacturing Equipment & Technology, Huazhong University of Science and Technology, Wuhan, 430074, China.
State Key Laboratory of Digital Manufacturing Equipment & Technology, Huazhong University of Science and Technology, Wuhan, 430074, China.
KTH, School of Industrial Engineering and Management (ITM), Production Engineering.ORCID iD: 0000-0001-9694-0483
KTH, School of Industrial Engineering and Management (ITM), Production Engineering.ORCID iD: 0000-0001-8679-8049
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2022 (English)In: Journal of manufacturing systems, ISSN 0278-6125, E-ISSN 1878-6642, Vol. 62, p. 753-766Article in journal (Refereed) Published
Abstract [en]

In modern manufacturing, vision-based defect recognition is an essential technology to guarantee product quality, and it plays an important role in industrial intelligence. With the developments of industrial big data, defect images can be captured by ubiquitous sensors. And, how to realize accuracy recognition has become a research hotspot. In the past several years, many vision-based defect recognition methods have been proposed, and some newly-emerged techniques, such as deep learning, have become increasingly popular and have addressed many challenging problems effectively. Hence, a comprehensive review is urgently needed, and it can promote the development and bring some insights in this area. This paper surveys the recent advances in vision-based defect recognition and presents a systematical review from a feature perspective. This review divides the recent methods into designed-feature based methods and learned-feature based methods, and summarizes the advantages, disadvantages and application scenarios. Furthermore, this paper also summarizes the performance metrics for vision-based defect recognition methods. And some challenges and development trends are also discussed. 

Place, publisher, year, edition, pages
Elsevier BV , 2022. Vol. 62, p. 753-766
Keywords [en]
Deep learning, Defect recognition, Feature extraction, Industrial intelligence, Review, Application scenario, Defect recognition methods, Development trends, Feature-based method, Paper surveys, Performance metrics, Ubiquitous sensor, Defects
National Category
Computer graphics and computer vision Computer Sciences
Identifiers
URN: urn:nbn:se:kth:diva-309652DOI: 10.1016/j.jmsy.2021.05.008ISI: 000772824200002Scopus ID: 2-s2.0-85106385831OAI: oai:DiVA.org:kth-309652DiVA, id: diva2:1642948
Note

QC 20250508

Available from: 2022-03-08 Created: 2022-03-08 Last updated: 2025-05-08Bibliographically approved

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Wang, Xi VincentWang, Lihui

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