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Regularized Sequential Latent Variable Models with Adversarial Neural Networks
KTH, School of Electrical Engineering and Computer Science (EECS), Intelligent systems, Information Science and Engineering.
KTH, School of Electrical Engineering and Computer Science (EECS), Intelligent systems, Information Science and Engineering.ORCID iD: 0000-0002-5407-0835
2021 (English)In: 20Th IEEE International Conference On Machine Learning And Applications (ICMLA 2021) / [ed] Wani, MA Sethi, I Shi, W Qu, G Raicu, DS Jin, R, Institute of Electrical and Electronics Engineers (IEEE) , 2021, p. 834-839Conference paper, Published paper (Refereed)
Abstract [en]

The highly structured sequential data, such as from speech and handwriting, often contain complex relationships between the underlaying variational factors and the observed data. This paper will present different ways of using high level latent random variables in RNN to model the variability in the sequential data. We have developed the two-steps training algorithms of such RNN model under the VAE (Variational Autoencoder) principle. We proposed novel approach of using adversarial training to regularize the latent variable distributions in the variational RNN model. Contrary to competing approaches, our approach has theoretical optimum in the model training and provides better model training stability. Our approach also improves the posterior approximation in the variational inference network by a separated adversarial training step. Numerical results simulated from TIMIT speech data show that reconstruction loss and evidence lower bound converge to the same level and adversarial training loss converges to 0.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2021. p. 834-839
Keywords [en]
GAN, autoencoder, variatonal recurrent model
National Category
Control Engineering
Identifiers
URN: urn:nbn:se:kth:diva-312972DOI: 10.1109/ICMLA52953.2021.00138ISI: 000779208200130Scopus ID: 2-s2.0-85125857422OAI: oai:DiVA.org:kth-312972DiVA, id: diva2:1661781
Conference
20th IEEE International Conference on Machine Learning and Applications (ICMLA), DEC 13-16, 2021, ELECTR NETWORK
Note

QC 20220530

Part of proceedings ISBN 978-1-6654-4337-1

Available from: 2022-05-30 Created: 2022-05-30 Last updated: 2022-06-25Bibliographically approved

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Huang, JinXiao, Ming

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CiteExportLink to record
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Citation style
  • apa
  • ieee
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  • Other style
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  • de-DE
  • en-GB
  • en-US
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Output format
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