Non-contact interferometric technique for fabrication of silica microspheres with improved ellipticity 2020 (English)In: Optics InfoBase Conference Papers, The Optical Society , 2020Conference paper, Published paper (Refereed)

Abstract [en]

Monitoring the back-scattered light from a microsphere, acting as a low-Q concentric cavity interferometer, enables non-contact, in-situ measurement of diameter variations. The interferometric technique is used for improving ellipticity during microsphere fabrication and characterization. 

Place, publisher, year, edition, pages

The Optical Society , 2020.

Keywords [en]

Fabrication, Interferometry, Silica, Back-scattered, Diameter variation, Fabrication and characterizations, In-situ measurement, Interferometric techniques, Measurements of, Non-contact, Silica microspheres, Microspheres

National Category

Condensed Matter Physics Control Engineering Atom and Molecular Physics and Optics

Identifiers

URN: urn:nbn:se:kth:diva-313892Scopus ID: 2-s2.0-85118709454OAI: oai:DiVA.org:kth-313892DiVA, id: diva2:1668419

Conference

Optical Sensors, Sensors 2020 - Part of Optical Sensors and Sensing Congress 2020, 22 June 2020 through 26 June 2020

Note

Part of proceedings: ISBN 9781557528209, QC 20220613

Available from: 2022-06-13 Created: 2022-06-13 Last updated: 2022-06-25Bibliographically approved

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Harvey, ClarissaMühlberger, KorbinianFokine, Michael

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Condensed Matter PhysicsControl EngineeringAtom and Molecular Physics and Optics

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