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Reply to comment on "Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)"
Pan, Jinshan
KTH, School of Engineering Sciences in Chemistry, Biotechnology and Health (CBH), Chemistry, Surface and Corrosion Science.
ORCID iD:
0000-0002-4431-0671
Yue, Xiaoqi
KTH, School of Engineering Sciences in Chemistry, Biotechnology and Health (CBH), Chemistry, Surface and Corrosion Science.
ORCID iD:
0000-0002-6218-2108
Malmberg, Per
Chalmers Univ Technol, Dept Chem & Chem Engn, Gothenburg, Sweden..
Isotahdon, Elisa
VTT Tech Res Ctr Finland Ltd, Espoo, Finland..
Ratia-Hanby, Vilma
VTT Tech Res Ctr Finland Ltd, Espoo, Finland..
Huttunen-Saarivirta, Elina
VTT Tech Res Ctr Finland Ltd, Espoo, Finland..
Leygraf, Christopher
KTH, School of Engineering Sciences in Chemistry, Biotechnology and Health (CBH), Chemistry, Surface and Corrosion Science.
ORCID iD:
0000-0002-9453-1333
Show others and affiliations
2023 (English)
In:
Corrosion Science, ISSN 0010-938X, E-ISSN 1879-0496, Vol. 217, article id 111137
Article in journal, Letter (Refereed) Published
Place, publisher, year, edition, pages
Elsevier BV , 2023. Vol. 217, article id 111137
Keywords [en]
Copper, Nuclear waste disposal, Sulphur-induced corrosion, Hydrogen embrittlement, ToF-SIMS, Nano-SIMS
National Category
Analytical Chemistry
Identifiers
URN:
urn:nbn:se:kth:diva-326872
DOI:
10.1016/j.corsci.2023.111137
ISI:
000975166200001
Scopus ID:
2-s2.0-85151452206
OAI: oai:DiVA.org:kth-326872
DiVA, id:
diva2:1756859
Note
QC 20230515
Available from:
2023-05-15
Created:
2023-05-15
Last updated:
2024-05-02
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Pan, Jinshan
Yue, Xiaoqi
Leygraf, Christopher
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