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ECSAS: Exploring critical scenarios from action sequence in autonomous driving
University of Chinese Academy of Sciences, Beijing, China; Institute of Software Chinese Academy of Sciences, Beijing, China.
University of Chinese Academy of Sciences, Beijing, China Institute of Software Chinese Academy of Sciences, Beijing, China; .
KTH, School of Industrial Engineering and Management (ITM), Engineering Design, Mechatronics and Embedded Control Systems.ORCID iD: 0000-0002-8028-3607
Institute of Software Chinese Academy of Sciences, Beijing, China.
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2023 (English)In: Proceeding of 2023 IEEE 32nd Asian Test Symposium (ATS), Institute of Electrical and Electronics Engineers (IEEE), 2023, p. 1-6Conference paper, Published paper (Refereed)
Abstract [en]

Rare critical scenarios are crucial to verify the performance of autonomous driving in different situations. Critical scenario generation requires the ability of sampling critical combinations from an infinite parameter space in the logical scenario. Existing solutions aim to explore the correlation of action parameters in the initial scenario rather than action sequences. How to model action sequences so that one can further consider the effects of different action parameters is the bottleneck of the problem. In this paper, we solve the problem by proposing the ECSAS framework. Specifically, we first propose a description language, BTScenario, allowing us to model action sequences of scenarios. We then use reinforcement learning to search for combinations of critical action parameters. Several optimizations are proposed to increase efficiency, including action mask and replay buffer. Experimental results show that our model with strong collision ability and effectively outperforms the existing methods on various nontrivial scenarios.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2023. p. 1-6
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:kth:diva-340041DOI: 10.1109/ATS59501.2023.10317968ISI: 001108557200018Scopus ID: 2-s2.0-85179178523OAI: oai:DiVA.org:kth-340041DiVA, id: diva2:1814531
Conference
2023 IEEE 32nd Asian Test Symposium (ATS), 14-17 October 2023, Beijing, China
Note

Part of ISBN 979-8-3503-0310-0

QC 20231201

Available from: 2023-11-24 Created: 2023-11-24 Last updated: 2024-02-01Bibliographically approved

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Su, Peng

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CiteExportLink to record
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Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
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  • de-DE
  • en-GB
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Output format
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