Insight of proton transport phenomena in semiconductor ionic materialsShow others and affiliations
2024 (English)In: Journal of Power Sources, ISSN 0378-7753, E-ISSN 1873-2755, Vol. 598, article id 234148Article, review/survey (Refereed) Published
Abstract [en]
Semiconductor ionic materials (SIM) have recently gained broad attention due to their unique structural and chemical properties that enable efficient proton transport, making them promising materials for advanced fuel cell applications. This mini-review provides an overview of the proton transport phenomena in SIM and discusses their significance and future perspectives. We discuss the different types of SIMs, their proton transport mechanisms, and the factors that affect their performance. Furthermore, we emphasize the correlation between traditional perovskite oxides and SIMs and how this can be leveraged to improve the development of more advanced proton conductors for fuel cells. Also, we have highlighted the Proton-coupled electron transfer (PCET) mechanism in SIM. This mini-review provides a comprehensive overview of the current state of this emerging field, including its scientific foundations, future prospects, and applicable materials, technologies, devices, and basics for proton ceramic fuel cells (PCFCs).
Place, publisher, year, edition, pages
Elsevier BV , 2024. Vol. 598, article id 234148
Keywords [en]
Proton conduction, Proton coupled electron transfer (PCET), Semiconductor ionic materials (SIM), Surface and interfacial engineering
National Category
Energy Systems
Identifiers
URN: urn:nbn:se:kth:diva-344547DOI: 10.1016/j.jpowsour.2024.234148ISI: 001188951400001Scopus ID: 2-s2.0-85187263155OAI: oai:DiVA.org:kth-344547DiVA, id: diva2:1845935
Note
QC 20240412
2024-03-202024-03-202024-04-12Bibliographically approved