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Short Circuit Protection of Silicon Carbide MOSFETs: Challenges, Methods, and Prospects
Hefei Univ Technol, Anhui Prov Key Lab Semicond Packaging & Reliabil, Hefei 230009, Peoples R China..
Hefei Univ Technol, Anhui Prov Key Lab Semicond Packaging & Reliabil, Hefei 230009, Peoples R China..
Hefei Univ Technol, Anhui Prov Key Lab Semicond Packaging & Reliabil, Hefei 230009, Peoples R China..
Hefei Univ Technol, Anhui Prov Key Lab Semicond Packaging & Reliabil, Hefei 230009, Peoples R China..
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2024 (English)In: IEEE transactions on power electronics, ISSN 0885-8993, E-ISSN 1941-0107, Vol. 39, no 10, p. 13081-13095Article in journal (Refereed) Published
Abstract [en]

With the fabulous growth of the renewable energy industry, silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (mosfets) are increasingly finding applications in various scenarios. To ensure the safe operation of SiC mosfets, there is a pressing need for fast and reliable short-circuit protection methods. This article aims to give a detail overview of the existing short-circuit protection technologies for SiC mosfets regarding their merits and limitations. First, the challenges associated with short-circuit protection are comprehensively analyzed. Subsequently, thorough comparisons of state-of-the-art short-circuit detection methods and soft turn-off strategies are conducted, respectively. Finally, this work outlines the prospects of short-circuit protection technologies in the aspects of deficiencies and optimization of short-circuit protection in multichip power module with paralleled SiC mosfets.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2024. Vol. 39, no 10, p. 13081-13095
Keywords [en]
Robustness, short-circuit protection, silicon carbide (SiC) MOSFETs, soft turn-OFF strategies
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-354607DOI: 10.1109/TPEL.2024.3430897ISI: 001304358100179Scopus ID: 2-s2.0-85199096213OAI: oai:DiVA.org:kth-354607DiVA, id: diva2:1904333
Note

QC 20241009

Available from: 2024-10-09 Created: 2024-10-09 Last updated: 2024-10-09Bibliographically approved

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Wang, Xiongfei

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