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Finite Sample Analysis for a Class of Subspace Identification Methods
KTH, School of Electrical Engineering and Computer Science (EECS), Intelligent systems, Decision and Control Systems (Automatic Control).
University of Pennsylvania, Philadelphia, PA, USA.
KTH, School of Electrical Engineering and Computer Science (EECS), Intelligent systems, Decision and Control Systems (Automatic Control).ORCID iD: 0000-0003-0355-2663
KTH, School of Electrical Engineering and Computer Science (EECS), Intelligent systems, Decision and Control Systems (Automatic Control).ORCID iD: 0000-0002-9368-3079
2024 (English)In: 2024 IEEE 63rd Conference on Decision and Control, CDC 2024, Institute of Electrical and Electronics Engineers (IEEE) , 2024, p. 2970-2976Conference paper, Published paper (Refereed)
Abstract [en]

While subspace identification methods (SIMs) are appealing due to their simple parameterization for MIMO systems and robust numerical realizations, a comprehensive statistical analysis of SIMs remains an open problem, especially in the non-asymptotic regime. In this work, we provide a finite sample analysis for a class of SIMs, which reveals that the convergence rates for estimating Markov parameters and system matrices are O(1 / SN), in line with classical asymptotic results. Based on the observation that the model format in classical SIMs is non-causal because of a projection step, we choose a parsimonious SIM that bypasses the projection step and strictly enforces a causal model to facilitate the analysis, where a bank of ARX models are estimated in parallel. Leveraging recent results from a finite sample analysis of an individual ARX model, we obtain a union error bound for an array of ARX models and proceed to derive error bounds for system matrices using robustness results for the singular value decomposition.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2024. p. 2970-2976
National Category
Control Engineering
Identifiers
URN: urn:nbn:se:kth:diva-361767DOI: 10.1109/CDC56724.2024.10885866Scopus ID: 2-s2.0-86000653788OAI: oai:DiVA.org:kth-361767DiVA, id: diva2:1948034
Conference
63rd IEEE Conference on Decision and Control, CDC 2024, Milan, Italy, December 16-19, 2024
Note

Part of ISBN 9798350316339

QC 20250328

Available from: 2025-03-27 Created: 2025-03-27 Last updated: 2025-03-28Bibliographically approved

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He, JiabaoRojas, Cristian R.Hjalmarsson, Håkan

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