A Scan Blindness Model for Single-Polarized Tapered-Slot Arrays in Triangular Grids
2008 (English)In: IEEE Transactions on Antennas and Propagation, ISSN 0018-926X, E-ISSN 0096-1973, Vol. 56, no 9, 2937-2942 p.Article in journal (Refereed) Published
A simple model is presented that predicts scan blindness in the E-plane for single polarized tapered-slot arrays where the elements are positioned in a triangular grid. The blindness occurs when the phase progression along the dielectric substrates is equal to the phase progression of a leaky mode in the structure. A simple equation is presented that estimates the frequency at which the scan blindness occurs for a given angle in the E-plane. This equation is derived from a simple representation of the phased array antenna, but includes the dominant effect of this particular class of scan blindness. The method is shown to agree well with computed results obtained with two different numerical codes.
Place, publisher, year, edition, pages
2008. Vol. 56, no 9, 2937-2942 p.
array, broadband-antennas, scan blindness, tapered-slot, triangular grid
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-10221DOI: 10.1109/TAP.2008.928780ISI: 000259407100017ScopusID: 2-s2.0-51749093123OAI: oai:DiVA.org:kth-10221DiVA: diva2:211534
QC 201007122009-04-162009-04-162011-11-08Bibliographically approved