Intermodulation atomic force microscopy
2008 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 92, 153106- p.Article in journal (Refereed) Published
A mode of atomic force microscopy ͑AFM͒ is demonstrated where an oscillating AFM cantileverhaving linear response is driven with two frequencies in the vicinity of a resonance. Newfrequencies in the response, known as intermodulation products, are generated when the linearity ofthe cantilever response is perturbed by the nonlinear tip-surface interaction. A rich structure of theintermodulation products is observed as a function of the probe-surface separation, indicating thatit is possible to extract much more detailed information about the tip-surface interaction than ispossible with the standard amplitude and phase imaging methods.
Place, publisher, year, edition, pages
2008. Vol. 92, 153106- p.
Atomic force microscopy, Nonlinear oscillations, Cantilevers; Surfaces; Tip
Condensed Matter Physics
IdentifiersURN: urn:nbn:se:kth:diva-11551DOI: 10.1063/1.2909569ISI: 000255117100081ScopusID: 2-s2.0-42349116023OAI: oai:DiVA.org:kth-11551DiVA: diva2:277681
QC 201008122009-11-202009-11-192013-05-27Bibliographically approved