Measurements of the Liquid Film Flow Rate in High Pressure Annular Flow with Various Axial Power Distributions
2005 (English)In: HEAT 2005, Gdansk, Poland, June 26–30, 2005, 2005Conference paper (Refereed)
This paper presents film flow measurement technique and the results with uniform power distribution. Based on these measurements it is possible to estimate the critical film thickness. The measured film thickness was plotted versus steam quality and slightlyextrapolated up to the measured critical steam quality. The conclusions werein line with Hewitt et al. (1965), i.e. that the critical film thickness is insignificantly small. This does not contradict e.g. Ueda & Isayama (1981) since the conditions were not the same, but for the flow conditions and heat fluxes that are typical for BWR operation it was concluded that the critical film thickness is, for practical purposes, zero.
Place, publisher, year, edition, pages
Film flow analysis, Measurements
Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:kth:diva-13426OAI: oai:DiVA.org:kth-13426DiVA: diva2:325305
QC 201006182010-06-182010-06-182010-11-08Bibliographically approved