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Dilution effect on the U-5f states: U in an Ag matrix
KTH, School of Industrial Engineering and Management (ITM), Materials Science and Engineering, Applied Material Physics.ORCID iD: 0000-0002-9920-5393
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2005 (English)In: Journal of Alloys and Compounds, ISSN 0925-8388, E-ISSN 1873-4669, Vol. 386, no 1-2, 70-74 p.Article in journal (Refereed) Published
Abstract [en]

The electronic structure of U-diluted in an Ag matrix has been studied in situ by ultraviolet and X-ray photoelectron spectroscopy (UPS and XPS, respectively). UxAg100-x thin films (x = 0-100 at.%) were produced by sputter co-deposition in an Ar atmosphere. UPS spectra of the Ag-4d line indicate formation of a homogeneous mixture despite the fact that U and Ag do not form stable alloys. A major goal of this work was to find out whether the dilution of U atoms in an inert matrix with no bonding states induces the localisation of the U-5f states. Both U-4f core level spectra and the U-5f spectra indicate U-5f delocalisation, down to 5 at.% of uranium in UxAg100-x films.

Place, publisher, year, edition, pages
2005. Vol. 386, no 1-2, 70-74 p.
Keyword [en]
thin films, dc sputtering, electronic band structure, photoelectron, spectroscopies, electronic-structure, metal-clusters, noble-metal, photoelectron-spectroscopy, 5f localization, d-bands, photoemission, silver, systems, transition
National Category
Metallurgy and Metallic Materials Condensed Matter Physics
Identifiers
URN: urn:nbn:se:kth:diva-14450DOI: 10.1016/j.jallcom.2004.05.058ISI: 000226186300013Scopus ID: 2-s2.0-10444285364OAI: oai:DiVA.org:kth-14450DiVA: diva2:332491
Note

QC 20150728

Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2017-12-12Bibliographically approved

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Korzhavyi, Pavel A.

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