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Polarization performance analysis of etched diffraction grating demultiplexer using boundary element method
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.ORCID iD: 0000-0002-3401-1125
2005 (English)In: IEEE Journal of Selected Topics in Quantum Electronics, ISSN 1077-260X, E-ISSN 1558-4542, Vol. 11, no 1, 224-231 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2005. Vol. 11, no 1, 224-231 p.
Keyword [en]
boundary-element method (BEM), demultiplexer, etched diffraction grating (EDG), insertion loss, planar, waveguide, polarization dependent loss (PDL), wavelength division multiplexing (WDM), wave-guide demultiplexer, electromagnetic scattering, sharp transitions, flat passband, design
Identifiers
URN: urn:nbn:se:kth:diva-14532DOI: 10.1109/jstqe.2004.841719ISI: 000227014900028Scopus ID: 2-s2.0-14544289600OAI: oai:DiVA.org:kth-14532DiVA: diva2:332573
Note
QC 20100525Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2017-12-12Bibliographically approved

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He, Sailing

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