Comparing two measurement techniques for high frequency characterization of power cable semi-conducting and insulating materials
2006 (English)In: IEEE transactions on dielectrics and electrical insulation, ISSN 1070-9878, E-ISSN 1558-4135, Vol. 13, no 4, 712-716 p.Article in journal (Refereed) Published
Understanding the high frequency characteristics of the materials that make up medium voltage extruded cables is important in establishing diagnostics schemes based on electromagnetic pulse propagation methods. Two measurement techniques have been developed and used to characterize the high frequency material properties of semi-conducting screens and cross linked polyethylene (XLPE) insulation up to 100 MHz. The experimental details, parameter extraction and limitations of the two measurement techniques are presented.
Place, publisher, year, edition, pages
2006. Vol. 13, no 4, 712-716 p.
complex permittivity, scattering parameters, insulation, semi-conducting, two-port, one-port, high frequency, measurements, characterization
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-15913DOI: 10.1109/TDEI.2006.1667728ISI: 000239705700004ScopusID: 2-s2.0-33748323309OAI: oai:DiVA.org:kth-15913DiVA: diva2:333955
QC 201005252010-08-052010-08-052010-10-18Bibliographically approved