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Analytical method for the identification of a thin-strip defect in a planar waveguide
KTH, School of Electrical Engineering (EES), Electromagnetic Engineering.ORCID iD: 0000-0002-3401-1125
2006 (English)In: Journal of the Optical Society of America a-Optics Image Science and Vision, ISSN 1084-7529, Vol. 23, no 10, 2650-2656 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2006. Vol. 23, no 10, 2650-2656 p.
Keyword [en]
principles, devices
URN: urn:nbn:se:kth:diva-16013ISI: 000240858500029ScopusID: 2-s2.0-33751207072OAI: diva2:334055
QC 20100525Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2013-11-19Bibliographically approved

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He, Sailing
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