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Sample preserving deep interface characterization technique
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2006 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 97, no 26Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2006. Vol. 97, no 26
Keyword [en]
electron-emission microscopy, magnetic tunnel-junctions, multilayers, magnetoresistance, scattering, alloys, cu
URN: urn:nbn:se:kth:diva-16234DOI: 10.1103/PhysRevLett.97.266106ISI: 000243167300029ScopusID: 2-s2.0-33846395108OAI: diva2:334276
QC 20100525Available from: 2010-08-05 Created: 2010-08-05Bibliographically approved

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Johansson, Börje
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Applied Material Physics
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