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Nuclear reaction analysis with ion microbeam of cross sections of surface layers deposited in a tokamak divertor
KTH, School of Electrical Engineering (EES), Fusion Plasma Physics.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
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2007 (English)In: Journal of Nuclear Materials, ISSN 0022-3115, E-ISSN 1873-4820, Vol. 362, no 03-feb, 215-221 p.Article in journal (Refereed) Published
Abstract [en]

Ion micro beam analysis has been applied to the investigation of plasma deposited layers covering the divertor tiles in the JET tokamak. Since the layers are about 100 mu m thick they are too thick to be completely investigated by ordinary ion beam analysis. Cross sections of the layers were prepared by cutting and polishing. Elemental depth profiles were determined from the two dimensional images that could be derived by nuclear reaction analysis and resonant backscattering spectrometry, using ion beams focused to a few mu m spot size. A combination of analysis methods are shown, which allow measurements of the concentration profiles of carbon, beryllium, deuterium, oxygen and stainless steel components at levels of a few percent, with an accuracy better than 10%.

Place, publisher, year, edition, pages
2007. Vol. 362, no 03-feb, 215-221 p.
Keyword [en]
jet limiters, retention, deuterium
National Category
Materials Engineering
URN: urn:nbn:se:kth:diva-16672DOI: 10.1016/j.jnucmat.2007.01.046ISI: 000246895400013ScopusID: 2-s2.0-34247563472OAI: diva2:334715
Conference: Symposium on Nuclear Materials and Materials for Fusion held at the E-MRS 2006 Spring Meeting. Nice, FRANCE. MAY 29-JUN 02, 2006 Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2011-09-13Bibliographically approved

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