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Direct characterization of focusing light by negative refraction in a photonic crystal flat lens
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
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2008 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 93, no 19Article in journal (Refereed) Published
Abstract [en]

We report experimental measurements of the field distribution of the light spot focused by a two-dimensional photonic crystal flat lens at wavelengths 1.51-1.58 mu m. The photonic crystal slab is fabricated on a silicon-on-insulator substrate by focused-ion-beam direct milling. We confirm the light focusing by the photonic crystal slab through direct observation of the light spot entering into free space at the end facet of the slab lens. The beam profiles as the function of lateral position are measured and the minimal full width half maximum of the beam at 1.2 mu m (0.77 lambda) is obtained.

Place, publisher, year, edition, pages
2008. Vol. 93, no 19
Keyword [en]
focused ion beam technology, lenses, optical fabrication, optical, focusing, photonic crystals, refractive index, wave-guides, silicon, fabrication, slabs
URN: urn:nbn:se:kth:diva-17978DOI: 10.1063/1.3027069ISI: 000260944100014ScopusID: 2-s2.0-56249148163OAI: diva2:336023
QC 20100525Available from: 2010-08-05 Created: 2010-08-05Bibliographically approved

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Qiu, Min
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