Direct characterization of focusing light by negative refraction in a photonic crystal flat lens
2008 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 93, no 19Article in journal (Refereed) Published
We report experimental measurements of the field distribution of the light spot focused by a two-dimensional photonic crystal flat lens at wavelengths 1.51-1.58 mu m. The photonic crystal slab is fabricated on a silicon-on-insulator substrate by focused-ion-beam direct milling. We confirm the light focusing by the photonic crystal slab through direct observation of the light spot entering into free space at the end facet of the slab lens. The beam profiles as the function of lateral position are measured and the minimal full width half maximum of the beam at 1.2 mu m (0.77 lambda) is obtained.
Place, publisher, year, edition, pages
2008. Vol. 93, no 19
focused ion beam technology, lenses, optical fabrication, optical, focusing, photonic crystals, refractive index, wave-guides, silicon, fabrication, slabs
IdentifiersURN: urn:nbn:se:kth:diva-17978DOI: 10.1063/1.3027069ISI: 000260944100014ScopusID: 2-s2.0-56249148163OAI: oai:DiVA.org:kth-17978DiVA: diva2:336023
QC 201005252010-08-052010-08-05Bibliographically approved