Experimental demonstration of a cross-order echelle grating triplexer based on an amorphous silicon nanowire platform
2009 (English)In: Optics Letters, ISSN 0146-9592, E-ISSN 1539-4794, Vol. 34, no 3, 383-385 p.Article in journal (Refereed) Published
We present the design, fabrication, and characterization of an ultracompact silicon-on-insulator-based echelle grating triplexer. It is based on the cross-order design, which utilizes different diffraction orders to cover a large spectral range from 1.3 to 1.5 mu m with three channels located at 1310, 1490, and 1550 nm and with a footprint of 150 mu m X 130 mu m.
Place, publisher, year, edition, pages
2009. Vol. 34, no 3, 383-385 p.
passive optical network, wave-guides, design, circuit
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-18212ISI: 000263755800054ScopusID: 2-s2.0-59249101711OAI: oai:DiVA.org:kth-18212DiVA: diva2:336258
QC 201005252010-08-052010-08-052013-11-19Bibliographically approved