Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Rigorous modeling and physical interpretation of terahertz near-field imaging using SNOM techniques
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
2009 (English)Article in journal (Refereed) Published
Abstract [en]

Apertureless scanning near-field optical microscopy (SNOM) operating with terahertz (THz) laser pulses is a subject of great research interest. The Mie scattering theory is commonly used to explain the features of the optical waves produced by field interactions with SNOM tips and microstructures. However, since Mie scattering fails with SNOMs at submillimeter wavelengths, a rigorous model and analysis are desirable to assess the feasibility of the THz tip-enhanced scanning near-field techniques. In this paper, we present a numerical simulation of an apertureless SNOM imaging system in the THz band. A 2-dimensional model based on the finite element method (FEM) is investigated and discussed. The modeling results are in good agreement with the experimental data obtained for this system at 2 THz radiation [8]. Additionally, a physical interpretation using the antenna theory is successfully confirmed by the simulation results. [DOI: 10.2971/jeos.2009.09007]

Place, publisher, year, edition, pages
2009. Vol. 4
Keyword [en]
near-field microscopy, THz imaging, scattering measurements, metal, optics, optical microscopy, resolution
Identifiers
URN: urn:nbn:se:kth:diva-18304DOI: 10.2971/jeos.2009.09007ISI: 000264659600002Scopus ID: 2-s2.0-62949215037OAI: oai:DiVA.org:kth-18304DiVA: diva2:336350
Note
QC 20100525Available from: 2010-08-05 Created: 2010-08-05 Last updated: 2011-01-12Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Li, YanluPopov, SergeiFriberg, Ari T.
By organisation
Microelectronics and Applied Physics, MAP

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 28 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf