Endface reflectivities of optical nanowires
2009 (English)In: Optics Express, ISSN 1094-4087, Vol. 17, no 13, 10881-10886 p.Article in journal (Refereed) Published
Endface reflectivities (ERs) of optical nanowires are investigated using three-dimensional finite-difference time-domain simulations. Typical ERs of both free-standing and substrate-supported silica, tellurite, PMMA and semiconductor nanowires or nanofibers are obtained. Unlike in conventional waveguides such as optical fibers, ERs of nanowires are usually considerably lower when operated in single mode. Dependences of ER on the diameter and the refractive index of the nanowire, and the wavelength of the guided light are also investigated. These results are helpful for estimating and understanding ERs in optical nanowires with diameters close to or smaller than the wavelengths of the light, and may offer valuable references for practical applications such as nanowire or nanofiber-based resonators and lasers.
Place, publisher, year, edition, pages
2009. Vol. 17, no 13, 10881-10886 p.
silica nanowires, laser, wire, microfibers, emission
IdentifiersURN: urn:nbn:se:kth:diva-18583ISI: 000267761100049ScopusID: 2-s2.0-67649246572OAI: oai:DiVA.org:kth-18583DiVA: diva2:336630
QC 201005252010-08-052010-08-05Bibliographically approved