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Another dimension in device characterization
KTH, Superseded Departments, Electronics.
2000 (English)In: IEEE Circuits & Devices, ISSN 8755-3996, E-ISSN 1558-1888, Vol. 16, no 2, 12-18 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2000. Vol. 16, no 2, 12-18 p.
Keyword [en]
scanning capacitance microscopy
URN: urn:nbn:se:kth:diva-19668ISI: 000086375700007OAI: diva2:338360

QC 20100525

Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2014-12-11Bibliographically approved

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Srinivasan, Anand
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