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Measurements and modelling of pattern-dependent BER and jitter in reshaping optoelectronic repeaters
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2000 (English)In: IEE Proceedings - Optoelectronics, ISSN 1350-2433, E-ISSN 1359-7078, Vol. 147, no 2, 97-103 p.Article in journal (Refereed) Published
Abstract [en]

A reshaping optoelectronic repeater is investigated in a loop experiment. If such a device is used in an optical network, the jitter accumulation and its influence on the cascadability are important issues. Whereas the RMS jitter was fairly independent for PRBS patterns, the bit-error rate showed a large pattern dependence. In order to explain these results, a simplified model of the repeater is used, where the device is modelled as a filter followed by an ideal limiter.

Place, publisher, year, edition, pages
2000. Vol. 147, no 2, 97-103 p.
Keyword [en]
interferometric wavelength converters, noise, conversion
URN: urn:nbn:se:kth:diva-19756ISI: 000087033900004OAI: diva2:338448
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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