Measurements and modelling of pattern-dependent BER and jitter in reshaping optoelectronic repeaters
2000 (English)In: IEE Proceedings - Optoelectronics, ISSN 1350-2433, E-ISSN 1359-7078, Vol. 147, no 2, 97-103 p.Article in journal (Refereed) Published
A reshaping optoelectronic repeater is investigated in a loop experiment. If such a device is used in an optical network, the jitter accumulation and its influence on the cascadability are important issues. Whereas the RMS jitter was fairly independent for PRBS patterns, the bit-error rate showed a large pattern dependence. In order to explain these results, a simplified model of the repeater is used, where the device is modelled as a filter followed by an ideal limiter.
Place, publisher, year, edition, pages
2000. Vol. 147, no 2, 97-103 p.
interferometric wavelength converters, noise, conversion
IdentifiersURN: urn:nbn:se:kth:diva-19756ISI: 000087033900004OAI: oai:DiVA.org:kth-19756DiVA: diva2:338448
QC 201005252010-08-102010-08-10Bibliographically approved