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High resolution synchrotron radiation PES study of PbPc deposited on Pt(111)
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2000 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 162, 178-183 p.Article in journal (Refereed) Published
Abstract [en]

We studied lead phthalocyanine (PbPc) films sublimated under UHV conditions on a clean Pt(111) substrate. We report results from high resolution photoelectron spectra of the Pb 5d, Ph 4f, C 1s, N 1s and Pt 4f core level using synchrotron radiation. Comparison between ultra thin films and thicker films shows that the first molecular adlayer interacts strongly with the substrate and we report evidence of Pb-Pt alloy formation on the surface. For the thick films, the C Is and N Is core level spectra show usual characteristics, however in the case of ultra thin films, we note important differences with respect to some previous results.

Place, publisher, year, edition, pages
2000. Vol. 162, 178-183 p.
Keyword [en]
organic-semiconductors, semiconducting thin films, lead phthalocyanine, metal-organic molecule interface, synchrotron radiation photoelectron spectroscopy, ray photoelectron-spectroscopy, copper phthalocyanine, lead-phthalocyanine, thin-films, si(111)-7x7, si(001)-2x1, surfaces, stm, xps
URN: urn:nbn:se:kth:diva-19989ISI: 000088952000029OAI: diva2:338682
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Göthelid, Mats
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