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Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm
KTH, Superseded Departments, Signals, Sensors and Systems.ORCID iD: 0000-0002-2718-0262
2000 (English)In: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, E-ISSN 1557-9662, Vol. 49, no 6, 1189-1193 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2000. Vol. 49, no 6, 1189-1193 p.
Keyword [en]
IEEE standards, measurement standards, signal analysis, frequency estimation, electronic equipment testing
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Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-20303DOI: 10.1109/19.893254ISI: 000166528100005OAI: oai:DiVA.org:kth-20303DiVA: diva2:338997
Note
QC 20100525 QC 20111107Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Händel, Peter

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