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An X-ray imaging pixel detector based on scintillator filled pores in a silicon matrix
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0002-5260-5322
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2001 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 460, no 1, 15-19 p.Article in journal (Refereed) Published
Abstract [en]

An X-ray imaging pixel detector has been fabricated and preliminary testing has demonstrated a proof-of-principle. The detector is based on a conventional charge coupled detector (CCD)-imaging detector where a scintillator-filled silicon pore matrix provides enhanced X-ray sensitivity without sacrificing lateral resolution. The scintillator blocks inside the pores provide light guiding of the emitted Visible photons to increase the number of photons detected by the CCD element. Preliminary X-ray measurements demonstrate good lateral resolution although non-uniform filling of the pore matrix results in a pronounced fixed noise pattern. The detector has primary applications in dental imaging but would also be of importance in other imaging techniques where the X-ray absorption length exceeds lateral pixel size.

Place, publisher, year, edition, pages
2001. Vol. 460, no 1, 15-19 p.
Identifiers
URN: urn:nbn:se:kth:diva-20455ISI: 000167597000003OAI: oai:DiVA.org:kth-20455DiVA: diva2:339150
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Linnros, Jan

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