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A CMOS APS for dental X-ray imaging using scintillating sensors
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2001 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, Vol. 460, no 1, 197-203 p.Article in journal (Refereed) Published
Abstract [en]

In this paper we present an integrating CMOS Active Pixel Sensor (APS) circuit to be used with scintillator type X-ray sensors for intra oral dental X-ray imaging systems. Different pixel architectures were constructed to explore their performance characteristics and to study the feasibility of the development of such systems using the CMOS technology. A prototype 64 x 80 pixel array has been implemented in a CMOS 0.8 mum double poly n-well process with a pixel pitch of 50 mum. A spectral sensitivity measurement for the different pixels topologies, as well as measured X-ray direct absorption in the different APSs are presented. A measurement of the output signal showed a good linearity over a wide dynamic range. This chip showed that the very low sensitivity of the CMOS APSs to direct X-ray exposure adds a great advantage to the various CMOS advantages over CCD-based imaging systems,

Place, publisher, year, edition, pages
2001. Vol. 460, no 1, 197-203 p.
Keyword [en]
X-ray imaging, pixel detectors, readout electronics, CMOS APS, radiation imaging, photosensor, integrating pixel
Identifiers
URN: urn:nbn:se:kth:diva-20456ISI: 000167597000028OAI: oai:DiVA.org:kth-20456DiVA: diva2:339151
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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