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Lead phthalocyanine thin films on InAs(100)-(4 x 2)/c(8 x 2) studied by synchrotron radiation photoelectron spectroscopy
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2001 (English)In: Surface Science, ISSN 0039-6028, E-ISSN 1879-2758, Vol. 482, 1199-1204 p.Article in journal (Refereed) Published
Abstract [en]

We used synchrotron radiation photoelectron spectroscopy to study the interface between a thin film and an ordered single monolayer of lead phthalocyanine (PbPc) deposited on the clean InAs(1 0 0)-(4 x 2)/c(8 x 2) reconstructed surface. Analysis of the core level and valence band spectra gave information about the electronic properties of the interface, the interaction between the molecule and the substrate and the valence band offset of the heterojunction.

Place, publisher, year, edition, pages
2001. Vol. 482, 1199-1204 p.
Keyword [en]
heterojunctions, semiconducting films, indium arsenide, synchrotron radiation photoelectron spectroscopy, copper phthalocyanine, surfaces, photoemission, orientation, si(111)-7x7, si(001)-2x1, overlayers, growth, inas, xps
URN: urn:nbn:se:kth:diva-20854ISI: 000170302200074OAI: diva2:339551
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Göthelid, Mats
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