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The diagnostics of thermal kinetic coefficients for the optimization of film bolometer properties
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0001-8774-9302
2002 (English)In: Technical physics, ISSN 1063-7842, E-ISSN 1090-6525, Vol. 47, no 1, 114-120 p.Article in journal (Refereed) Published
Abstract [en]

A pulsed microwave technique for the fast and accurate diagnostics of a complete set of thermal kinetic coefficients in single-layer film structures is developed. The technique is tested on La-0.7(Pb0.7Sr0.3)(0.3)MnO3 films on LaAlO3 and SrTiO3 substrates-the structures featuring a temperature resistance coefficient of 5-7%, which is the highest for manganite-containing materials at room temperature. The results of numerical simulation show that the performance of the uncooled bolometers can be improved by optimizing the thermal conductivity of the substrate and matching the thermal resistances of the film-substrate and substrate-thermostat interfaces.

Place, publisher, year, edition, pages
2002. Vol. 47, no 1, 114-120 p.
Keyword [en]
thin-films
Identifiers
URN: urn:nbn:se:kth:diva-21239ISI: 000173169000019OAI: oai:DiVA.org:kth-21239DiVA: diva2:339937
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Khartsev, Sergiy

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