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Waveguiding effects in the measurement of optical gain in a layer of Si nanocrystals
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0002-5260-5322
2002 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 81, no 8, 1396-1398 p.Article in journal (Refereed) Published
Abstract [en]

We discuss applicability of the variable stripe length method to experimental investigation of optical gain in a luminescent layer that behaves like a planar waveguide. We show that an interplay between the output direction of guided light modes and the numerical aperture of the collection optics may lead to an artifact manifesting itself as an apparent but false gain. We propose a way to circumvent this inconvenience by using a shifting excitation spot complementary measurement. The method is demonstrated on a layer of Si nanocrystals embedded into a synthetic silica plate.

Place, publisher, year, edition, pages
2002. Vol. 81, no 8, 1396-1398 p.
Keyword [en]
emission
Identifiers
URN: urn:nbn:se:kth:diva-21803DOI: 10.1063/1.1502195ISI: 000177351600010OAI: oai:DiVA.org:kth-21803DiVA: diva2:340501
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Linnros, Jan

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