Change search
ReferencesLink to record
Permanent link

Direct link
Waveguiding effects in the measurement of optical gain in a layer of Si nanocrystals
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0002-5260-5322
2002 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 81, no 8, 1396-1398 p.Article in journal (Refereed) Published
Abstract [en]

We discuss applicability of the variable stripe length method to experimental investigation of optical gain in a luminescent layer that behaves like a planar waveguide. We show that an interplay between the output direction of guided light modes and the numerical aperture of the collection optics may lead to an artifact manifesting itself as an apparent but false gain. We propose a way to circumvent this inconvenience by using a shifting excitation spot complementary measurement. The method is demonstrated on a layer of Si nanocrystals embedded into a synthetic silica plate.

Place, publisher, year, edition, pages
2002. Vol. 81, no 8, 1396-1398 p.
Keyword [en]
URN: urn:nbn:se:kth:diva-21803DOI: 10.1063/1.1502195ISI: 000177351600010OAI: diva2:340501
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full text

Search in DiVA

By author/editor
Linnros, Jan
By organisation
Microelectronics and Information Technology, IMIT
In the same journal
Applied Physics Letters

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Altmetric score

Total: 13 hits
ReferencesLink to record
Permanent link

Direct link