Position sensitivity of a segmented planar Ge detector
2003 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, Vol. 496, no 03-feb, 373-384 p.Article in journal (Refereed) Published
A method to extract depth of interaction information for gamma-rays in a segmented planar Ge detector is presented. The method is demonstrated on signals from a segmented detector which were stored by a digital oscilloscope event by event and analysed off-line. Event samples were acquired for different interaction points in the detector. A Compton scatter coincidence detection technique ensured that the event samples were highly enriched in single-interaction events. By analysing pulse shapes and the relative timing between anode pulses and the pulses from the irradiated cathode segment, a position sensitivity of 1-2 mm in the depth direction was deduced. A similar transverse position sensitivity was inferred by studying image charge pulses on neighbouring segments.
Place, publisher, year, edition, pages
Elsevier, 2003. Vol. 496, no 03-feb, 373-384 p.
segmented planar Ge detector, Compton scattering, pulse shape analysis, position sensitivity, high-spin isomer, greta, array
IdentifiersURN: urn:nbn:se:kth:diva-22190DOI: 10.1016/S0168-9002(02)01743-6ISI: 000180478200014OAI: oai:DiVA.org:kth-22190DiVA: diva2:340888
QC 201005252010-08-102010-08-102015-04-29Bibliographically approved