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Position sensitivity of a segmented planar Ge detector
KTH, Superseded Departments, Physics.ORCID iD: 0000-0003-1771-2656
KTH, School of Engineering Sciences (SCI), Physics.ORCID iD: 0000-0003-1996-0805
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2003 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 496, no 03-feb, 373-384 p.Article in journal (Refereed) Published
Abstract [en]

A method to extract depth of interaction information for gamma-rays in a segmented planar Ge detector is presented. The method is demonstrated on signals from a segmented detector which were stored by a digital oscilloscope event by event and analysed off-line. Event samples were acquired for different interaction points in the detector. A Compton scatter coincidence detection technique ensured that the event samples were highly enriched in single-interaction events. By analysing pulse shapes and the relative timing between anode pulses and the pulses from the irradiated cathode segment, a position sensitivity of 1-2 mm in the depth direction was deduced. A similar transverse position sensitivity was inferred by studying image charge pulses on neighbouring segments.

Place, publisher, year, edition, pages
Elsevier, 2003. Vol. 496, no 03-feb, 373-384 p.
Keyword [en]
segmented planar Ge detector, Compton scattering, pulse shape analysis, position sensitivity, high-spin isomer, greta, array
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-22190DOI: 10.1016/S0168-9002(02)01743-6ISI: 000180478200014OAI: oai:DiVA.org:kth-22190DiVA: diva2:340888
Note

QC 20100525

Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Cederwall, BoBäck, Torbjörn

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