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Dynamic avalanche and reliability of high voltage diodes
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2003 (English)In: Microelectronics and reliability, ISSN 0026-2714, E-ISSN 1872-941X, Vol. 43, no 4, 529-536 p.Article in journal (Refereed) Published
Abstract [en]

Diode failures are a limiting factor for the reliability of power circuits. One failure reason is dynamic avalanche, Dynamic avalanche can be distinguished in three degrees, and some designs are rugged up to the third degree. Design modifications for improving the dynamic ruggedness and suitable test conditions are proposed.

Place, publisher, year, edition, pages
2003. Vol. 43, no 4, 529-536 p.
Keyword [en]
URN: urn:nbn:se:kth:diva-22431ISI: 000182363300003OAI: diva2:341129
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Domeij, Martin
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