Dynamic avalanche and reliability of high voltage diodes
2003 (English)In: Microelectronics and reliability, ISSN 0026-2714, E-ISSN 1872-941X, Vol. 43, no 4, 529-536 p.Article in journal (Refereed) Published
Diode failures are a limiting factor for the reliability of power circuits. One failure reason is dynamic avalanche, Dynamic avalanche can be distinguished in three degrees, and some designs are rugged up to the third degree. Design modifications for improving the dynamic ruggedness and suitable test conditions are proposed.
Place, publisher, year, edition, pages
2003. Vol. 43, no 4, 529-536 p.
IdentifiersURN: urn:nbn:se:kth:diva-22431ISI: 000182363300003OAI: oai:DiVA.org:kth-22431DiVA: diva2:341129
QC 201005252010-08-102010-08-10Bibliographically approved