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Scanning Kelvin probe force microscopy and magnetic force microscopy for characterization of duplex stainless steels
KTH, Superseded Departments, Materials Science and Engineering.ORCID iD: 0000-0002-4431-0671
KTH, Superseded Departments, Materials Science and Engineering.ORCID iD: 0000-0002-9453-1333
2003 (English)In: Journal of the Electrochemical Society, ISSN 0013-4651, Vol. 150, no 6, B274-B281 p.Article in journal (Refereed) Published
Abstract [en]

In this study, the Volta potential distribution over the surface of duplex stainless steels (DSSs) has been mapped for the first time with submicrometer resolution by scanning Kelvin probe force microscopy (SKPFM). The different magnetic properties of ferrite and austenite enable the utilization of magnetic force microscopy (MFM) for visualizing their surface distribution without the need of surface etching. The combined MFM and SKPFM mapping of the same area makes it possible to associate the variation in the Volta potential to the phase distribution and phase boundaries. The difference in potential between the two phases is measurable and significant. Generally, the ferrite phase was associated to regions of lower potential, and the austenite phase to regions of more noble potential. This can be regarded as direct evidence of galvanic interactions between the two phases. The phase boundary regions often exhibited a lower potential in the ferrite phase, indicating a higher tendency to corrosion. The high lateral resolution of SKPFM provides the possibility of comparing these results with those obtained from other localized techniques, a necessary step for a deeper understanding of the local corrosion processes in DSSs.

Place, publisher, year, edition, pages
2003. Vol. 150, no 6, B274-B281 p.
Keyword [en]
thin electrolyte layers, atmospheric corrosion, in-situ, atomic-force, potential distribution, tunneling-microscopy, active dissolution, pitting corrosion, metals, aa2024-t3
URN: urn:nbn:se:kth:diva-22509DOI: 10.1149/1.1572482ISI: 000182935600033OAI: diva2:341207
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Pan, JinshanLeygraf, Christofer
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