High-resolution domain imaging on the nonpolar y-face of periodically poled KTiOPO4 by means of atomic force microscopy
2003 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 83, no 4, 734-736 p.Article in journal (Refereed) Published
The inverse piezoelectric effect is used to produce high-resolution images of ferroelectric domains in periodically poled KTiOPO4 crystals on their nonpolar y-face using atomic force microscopy. We demonstrate that the technique is convenient for studying the nucleation and growth of domains in a periodically poled KTiOPO4 sample.
Place, publisher, year, edition, pages
2003. Vol. 83, no 4, 734-736 p.
ferroelectric domains, walls
Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:kth:diva-22692DOI: 10.1063/1.1593834ISI: 000184336600048OAI: oai:DiVA.org:kth-22692DiVA: diva2:341390
QC 201005252010-08-102010-08-102015-03-30Bibliographically approved