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Characterization of ultra-violet-induced changes in planar waveguides
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0001-5967-2651
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
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2003 (English)In: Journal of Optics. A, Pure and applied optics, ISSN 1464-4258, E-ISSN 1741-3567, Vol. 5, no 4, 335-340 p.Article in journal (Refereed) Published
Abstract [en]

A simple, low-cost spectrophotometer system operating in reflection absorption mode is used to characterize changes in refractive index and thickness of thin films under 193 nm irradiation. The results indicate overall dilation of the glass and are confirmed by additional surface topographic measurements. We also show that in addition to the net relaxation from laser annealing of the interface, in germanosilicate samples local compaction takes place. Since the net relaxation is triggered by remote interactions, it is not spatially confined to the laser-irradiated area. However, a local positive index change is observed. These results are in agreement with previous hypotheses put forward to explain planar waveguide negative index changes. They also bring to attention the great care necessary in both conducting and interpreting measurements that do not take into account spatial variations arising from the combination of remote and local triggers of both index and thickness changes.

Place, publisher, year, edition, pages
2003. Vol. 5, no 4, 335-340 p.
Keyword [en]
interfacial relaxation, negative refractive index, material dilation, type IIa gratings, optical fibers, index changes, ultraviolet-irradiation, induced densification, ge-sio2 preforms, bragg gratings, photosensitivity, glass
Identifiers
URN: urn:nbn:se:kth:diva-22722ISI: 000184571900006OAI: oai:DiVA.org:kth-22722DiVA: diva2:341420
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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