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Imaging of piezoelectric activity in laser-ablated c-axis-oriented LiNbO3/ZnO thin film multilayer on glass using atomic force microscopy
KTH, Superseded Departments, Materials Science and Engineering.ORCID iD: 0000-0003-4889-4210
KTH, Superseded Departments, Materials Science and Engineering.
2003 (English)In: Journal of Materials Research, ISSN 0884-2914, E-ISSN 2044-5326, Vol. 18, no 9, 2025-2028 p.Article in journal (Refereed) Published
Abstract [en]

A LiNbO3/ZnO multilayer with a preferred c-axis orientation normal to the plane of the substrate was grown on glass and SiO2/Si substrates by laser ablation. The piezoelectric activity in as-deposited films was demonstrated using a novel approach to the atomic force microscope. In the presence of an in-plane, low-frequency (0.1-5 Hz) alternating current electric field, we monitored and imaged the induced piezoelectric response normal to the film plane between two electrodes.

Place, publisher, year, edition, pages
2003. Vol. 18, no 9, 2025-2028 p.
Keyword [en]
domain-structure, deposition, interface, crystal, zno
Identifiers
URN: urn:nbn:se:kth:diva-22788ISI: 000185154600005OAI: oai:DiVA.org:kth-22788DiVA: diva2:341486
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Belova, Lyubov M.

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