Imaging of piezoelectric activity in laser-ablated c-axis-oriented LiNbO3/ZnO thin film multilayer on glass using atomic force microscopy
2003 (English)In: Journal of Materials Research, ISSN 0884-2914, Vol. 18, no 9, 2025-2028 p.Article in journal (Refereed) Published
A LiNbO3/ZnO multilayer with a preferred c-axis orientation normal to the plane of the substrate was grown on glass and SiO2/Si substrates by laser ablation. The piezoelectric activity in as-deposited films was demonstrated using a novel approach to the atomic force microscope. In the presence of an in-plane, low-frequency (0.1-5 Hz) alternating current electric field, we monitored and imaged the induced piezoelectric response normal to the film plane between two electrodes.
Place, publisher, year, edition, pages
2003. Vol. 18, no 9, 2025-2028 p.
domain-structure, deposition, interface, crystal, zno
IdentifiersURN: urn:nbn:se:kth:diva-22788ISI: 000185154600005OAI: oai:DiVA.org:kth-22788DiVA: diva2:341486
QC 201005252010-08-102010-08-10Bibliographically approved