Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Comparative characteristics of Na0.5K0.5NbO3 films on Pt by pulsed laser deposition and magnetron sputtering
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.ORCID iD: 0000-0001-8774-9302
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
Show others and affiliations
2003 (English)In: Integrated Ferroelectrics, ISSN 1058-4587, E-ISSN 1607-8489, Vol. 55, 769-779 p.Article in journal (Refereed) Published
Abstract [en]

Ferroelectric Na0.5K0.5 NbO3 (NKN) thin films were grown on the Pt 80 Ir 20 polycrystalline substrates by pulsed laser deposition (PLD) and radio frequency-magnetron sputtering (RF) technique using the same stoichiometric Na0.5K0.5NbO3 ceramic target. X-ray diffraction proved both PLD- and RF-made Na0.5K0.5 NbO3/Pt80Ir20 films are single phase and have preferential c -axis orientation. Temperature dependence of dielectric permittivity reveals the presence of two phase transitions around 210 and 410degreesC. Capacitance vs. applied voltage C-V @ 100 kHz, I-V , and P-E hysteresis characteristics recorded for the vertical capacitive structures yielded loss tandelta = 0.026 and 0.016, tunability about 44.5 and 30% @ 100 kV/cm, Ohmic resistivity 6.7 x 10(12) Omega.cm and 0.2 x 10(12) Omega.cm, remnant polarization 11.7 and 9.7 muC/cm(2) , coercive field 28.0 and 94.6 kV/cm for PLD- and RF-films, respectively. Piezoelectric test carried out in hydrostatic conditions showed piezoelectric coefficient d H = 21 for PLD-NKN and 15 pC/N for RF-NKN film.

Place, publisher, year, edition, pages
2003. Vol. 55, 769-779 p.
Keyword [en]
Na0.5K0.5NbO3 (NKN) films, pulsed laser deposition (PLD), RF-magnetron sputtering, tunability, K-factor, leakage current, piezoelectric coefficient d(H)
Identifiers
URN: urn:nbn:se:kth:diva-23055ISI: 000187625800003OAI: oai:DiVA.org:kth-23055DiVA: diva2:341753
Note
QC 20100525Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

Open Access in DiVA

No full text

Authority records BETA

Khartsev, Sergiy

Search in DiVA

By author/editor
Khartsev, SergiyGrishin, Alexander M.
By organisation
Microelectronics and Information Technology, IMIT
In the same journal
Integrated Ferroelectrics

Search outside of DiVA

GoogleGoogle Scholar

urn-nbn

Altmetric score

urn-nbn
Total: 48 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf