Measurement technique for high frequency characterization of semi-conducting materials in extruded cables
2004 (English)In: IEEE transactions on dielectrics and electrical insulation, ISSN 1070-9878, E-ISSN 1558-4135, Vol. 11, no 3, 471-480 p.Article in journal (Refereed) Published
Knowledge on the dependence of wave propagation characteristics on material properties and cable design is important in establishing diagnostic methods for cable insulation. In this study, a high frequency measurement technique to characterize the semi-conducting screens in medium voltage cross-linked polyethylene (XLPE) cables has been developed. The frequency ranges from 30 kHz to 500 MHz. The influence of the experimental set-up, sample preparation methods, pressure and temperature are investigated. A dielectric function is developed for the semiconducting screens and this is incorporated into a high frequency model for the cable. The propagation characteristics obtained from the high frequency cable model are compared with those obtained from measurements made on the same cables.
Place, publisher, year, edition, pages
2004. Vol. 11, no 3, 471-480 p.
semi-conducting screen, semicon, geometric capacitance, admittance, complex permittivity, dielectric function, propagation constant, attenuation, high frequency cable model, scattering parameters, cross-linked polyethylene, XLPE, cables
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-23514DOI: 10.1109/TDEI.2004.1306725ISI: 000222131200009ScopusID: 2-s2.0-3142685105OAI: oai:DiVA.org:kth-23514DiVA: diva2:342212
QC 20100525 QC 201110262010-08-102010-08-102011-10-26Bibliographically approved