Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Scanning capacitance microscopy investigations of lnGaAs/InP quantum wells
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
KTH, Superseded Departments, Microelectronics and Information Technology, IMIT.
2004 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 459, no 02-jan, 67-70 p.Article in journal (Refereed) Published
Abstract [en]

In this work, cross-sectional scanning capacitance microscopy (SCM) is used to investigate InGaAs/InP (latticed matched) quantum wells grown by metal-organic vapor phase epitaxy. Using n-doped InP as barriers with different doping levels, different InGaAs wells structures (5, 10 and 20 nm) were investigated. The capability of SCM to detect electrons in the quantum wells is demonstrated, showing in addition, a systematic and consistent trend for the different well widths and barrier doping levels. The SCM results are qualitatively consistent with electron distribution obtained for 1D Poisson/Schrodinger simulation. Finally, resolution issues in SCM are discussed in terms of tip averaging effects.

Place, publisher, year, edition, pages
2004. Vol. 459, no 02-jan, 67-70 p.
Keyword [en]
quantum-wells, band-offset, scanning capacitance microscopy, resolution InP, gainp
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:kth:diva-23523DOI: 10.1016/j.tsf.2003.12.097ISI: 000222217100015Scopus ID: 2-s2.0-2942563975OAI: oai:DiVA.org:kth-23523DiVA: diva2:342221
Note
QC 20100525 QC 20111018. nces: 12 [ view related records ] Citation MapCitation Map Conference: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG). Berlin, GERMANY. JUN 23-26, 2003 Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Douheret, OlivierMaknys, KestutisAnand, Srinivasan
By organisation
Microelectronics and Information Technology, IMIT
In the same journal
Thin Solid Films
Materials Engineering

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 29 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf