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Relaxation dynamics of SF6 studied by energy-resolved electron ion coincidence technique
KTH, Superseded Departments, Physics.
KTH, Superseded Departments, Physics.
KTH, Superseded Departments, Physics.
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2004 (English)In: Journal of Electron Spectroscopy and Related Phenomena, ISSN 0368-2048, E-ISSN 1873-2526, Vol. 137-40, 369-375 p.Article in journal (Refereed) Published
Abstract [en]

The mass spectra from the SF6 molecule acquired by energy-resolved electron ion coincidence (EREICO) technique using (1t(1g) + [5t(1u),1t(2u)]), (3e(g) + 1t(2g)), 4t(1u), and 5a(1g) electrons after both valence and S 2p(-1) 6a(1g) core excitation reveal a strong selectivity in the dissociation from these states. From the comparison of the obtained spectra, the influence of the core-excited state in the relaxation pathway of the molecule is studied. The S 2p --> 6a(1g) core excitation does not affect the relaxation dynamics after participator Auger decay to the (1t(1g) + [5t(1u),1t(2u)])(-1) and (4t(1u))(-l) states, but it alters the relaxation dynamics after participator Auger decay to the (3e(g) + 1t(2g))(-1) and (5a(1g))(-1) states with respect to the decay processes after direct excitation of the same orbitals. These observations point to core excitation induced dissociation in the SF6 molecule.

Place, publisher, year, edition, pages
2004. Vol. 137-40, 369-375 p.
Keyword [en]
relaxation dynamics, ion coincidence technique, SF6 molecule, threshold photoelectron-spectroscopy, auger-electron, dissociative photoionization, synchrotron-radiation, fragmentation, ionization, molecule, sulfur, states, decay
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-23532DOI: 10.1016/j.elspec.2004.02.113ISI: 000222251900056Scopus ID: 2-s2.0-2942569352OAI: oai:DiVA.org:kth-23532DiVA: diva2:342230
Note
QC 20100525 QC 20111018 QC 20111101. 9th International Conference on Electronic Spectroscopy and Structure. Uppsala, SWEDEN. JUN 30-JUL 04, 2003Available from: 2010-08-10 Created: 2010-08-10 Last updated: 2017-12-12Bibliographically approved

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Rachlew, Elisabeth

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Riu, Jaume Rius I.Ruiz, J. AlvarezErman, PeterKivimaki, AnttiGarcia, E. MeleroRachlew, Elisabeth
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