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High resolution x-ray absorption spectroscopy using a laser plasma radiation source
2004 (English)In: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 75, no 11, 4606-4609 p.Article in journal (Refereed) Published
Abstract [en]

In this article we present a setup of a spectrometer for near edge x-ray absorption spectroscopy at the carbon K-edge (284 eV). The spectrometer works with a laser produced plasma as x-ray source and a single x-ray optical element in grazing incidence configuration called off-axis reflection zone plate. Using different sample foils we were able to demonstrate a spectral resolution of E/DeltaEapproximate to600. The positions of specific absorption peaks are in agreement with data measured at synchrotron sources. Since the off-axis zone plate is a focusing system, the x-ray flux in the detector plane is high enough to record an absorption spectrum on a charge-coupled device detector with a single shot. In the single shot modus a spectrum can be recorded before a sample degradation takes place. This will enable time-resolved experiments using pump-probe techniques.

Place, publisher, year, edition, pages
2004. Vol. 75, no 11, 4606-4609 p.
Keyword [en]
spectra, poly(ethylene-terephthalate), films
URN: urn:nbn:se:kth:diva-23867DOI: 10.1063/1.1808071ISI: 000224962900038OAI: diva2:342566
QC 20100525Available from: 2010-08-10 Created: 2010-08-10Bibliographically approved

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Vogt, Ulrich
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