High frequency characterization of the semi-conducting screens of medium voltage XLPE cables
2002 (English)In: Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on, Cancun, 2002, 887-890 p.Conference paper (Refereed)
In this study, a high frequency measurement technique to characterize the semi-conducting materials of the medium voltage XLPE cables in the frequency range of 30 kHz to 500 Mhz has been developed. The influence of the experimental set-up and the sample preparation methods are investigated. A dielectric response model is then developed for the semiconducting materials and this is incorporated into a model for the whole cable. The propagation characteristics obtained from the cable model are then compared with those obtained from measurements carried out on the actual XLPE cables.
Place, publisher, year, edition, pages
Cancun, 2002. 887-890 p.
Capacitance, Dielectric materials, Electric admittance, Electric potential, Permittivity, Semi-conducting screens, Electric cables
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-25302DOI: 10.1109/CEIDP.2002.1048937OAI: oai:DiVA.org:kth-25302DiVA: diva2:357228
2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena; Cancun; 20 October 2002 through 24 October 2002
QC 201010152010-10-152010-10-152010-10-18Bibliographically approved