Development of a measurement technique for high frequency characterization of insulation materials
2004 (English)In: 2004 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, NEW YORK: IEEE , 2004, 206-209 p.Conference paper (Refereed)
A technique to measure the high frequency characteristics of insulation materials has been developed. Using this technique, high frequency characteristics of known insulation materials have been obtained to check its accuracy. The test cell, measurement technique and the extraction of the relevant parameters from the measurements are discussed.
Place, publisher, year, edition, pages
NEW YORK: IEEE , 2004. 206-209 p.
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-25307DOI: 10.1109/CEIDP.2004.1364225ISI: 000225187200049ScopusID: 2-s2.0-17744374481ISBN: 0-7803-8584-5OAI: oai:DiVA.org:kth-25307DiVA: diva2:357230
Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Boulder, CO, OCT 17-20, 2004
QC 201010152010-10-152010-10-152010-10-18Bibliographically approved