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Assessment of a nanoparticle bridge platform for molecular electronics measurements
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2010 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 21, no 43, 435204- p.Article in journal (Refereed) Published
Abstract [en]

A combination of electron beam lithography, photolithography and focused ion beam milling was used to create a nanogap platform, which was bridged by gold nanoparticles in order to make electrical measurements and assess the platform under ambient conditions. Non-functionalized electrodes were tested to determine the intrinsic response of the platform and it was found that creating devices in ambient conditions requires careful cleaning and awareness of the contributions contaminants may make to measurements. The platform was then used to make measurements on octanethiol (OT) and biphenyldithiol (BPDT) molecules by functionalizing the nanoelectrodes with the molecules prior to bridging the nanogap with nanoparticles. Measurements on OT show that it is possible to make measurements on relatively small numbers of molecules, but that a large variation in response can be expected when one of the metal-molecule junctions is physisorbed, which was partially explained by attachment of OT molecules to different sites on the surface of the Au electrode using a density functional theory calculation. On the other hand, when dealing with BPDT, high yields for device creation are very difficult to achieve under ambient conditions. Significant hysteresis in the I-V curves of BPDT was also observed, which was attributed primarily to voltage induced changes at the interface between the molecule and the metal.

Place, publisher, year, edition, pages
2010. Vol. 21, no 43, 435204- p.
Keyword [en]
A-density, Ambient conditions, Au electrodes, Electrical measurement, Focused ion beam milling, Functionalized electrodes, Gold Nanoparticles, High yield, I - V curve, Intrinsic response, Nano-electrodes, Nano-gap, Nanoparticle bridges, Octanethiol, Physisorbed, Cable stayed bridges, Density functional theory, Electron beams, Molecular electronics, Nanoparticles, Photolithography
National Category
Engineering and Technology
URN: urn:nbn:se:kth:diva-26631DOI: 10.1088/0957-4484/21/43/435204ISI: 000282511100005ScopusID: 2-s2.0-77958601197OAI: diva2:375035
QC 20101207Available from: 2010-12-07 Created: 2010-11-26 Last updated: 2010-12-07Bibliographically approved

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Ahuja, Rajeev
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Applied Material Physics
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