Localizing micro-defects on rough metal surfaces
2006 (English)In: Proceeding of the 2nd International Conference on Multi-Material Micro Manufacture 2006, Grenoble, FR / [ed] Wolfgang Menz, Stefan Dimov and Bertrand Fillon, Amsterdam: Elsevier, 2006, 169-172 p.Conference paper (Refereed)
In this paper we present a study of reflectance measurements to a direct metrological problem. Our aim is to estimate progressive surface wear by detecting minute defect development in surface microtopography on Ra 0.7 μm rough stainless steel surfaces subject to mechanical wear from hard particle deposits on a metal bar. The investigation was carried out by using a standard CMOS digital camera with a macro objective. It demonstrates how surface scattering measurements can provide a viable alternative in circumstances where traditional roughness measurement techniques fail to deliver the expected results and, due to certain restraints, laboratory-type surface measurements are not applicable either. Our work is based upon measuring variations in the amount and direction of scattered light, reflected from the inspected surfaces, featuring microirregularities. We will show that it is possible to identify the extent of surface flaws by statistically evaluating the recorded brightness information. The developments in this paper can provide basis for a future quality control system devoted to on-line surface measurements of micro components.
Place, publisher, year, edition, pages
Amsterdam: Elsevier, 2006. 169-172 p.
surface roughness, defect assessment, reflectance, light scattering, digital camera
Production Engineering, Human Work Science and Ergonomics Nano Technology
Research subject SRA - Production
IdentifiersURN: urn:nbn:se:kth:diva-27703ISBN: 978-0-08-045263-9ISBN: 0-08-045263-0OAI: oai:DiVA.org:kth-27703DiVA: diva2:379815
4M 2006, 20-22 Sept, Grenoble, France
Projects4M Multi Material Micro Manufacture Network of Excellence
FunderXPRES - Initiative for excellence in production research