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Localizing micro-defects on rough metal surfaces
KTH, School of Industrial Engineering and Management (ITM), Production Engineering, Metrology and Optics.
KTH, School of Industrial Engineering and Management (ITM), Production Engineering, Metrology and Optics.ORCID iD: 0000-0002-0105-4102
KiMAB - Corrosion and Metals Research Institute, Stockholm.
2006 (English)In: Proceeding of the 2nd International Conference on Multi-Material Micro Manufacture 2006, Grenoble, FR / [ed] Wolfgang Menz, Stefan Dimov and Bertrand Fillon, Amsterdam: Elsevier, 2006, 169-172 p.Conference paper, Published paper (Refereed)
Abstract [en]

In this paper we present a study of reflectance measurements to a direct metrological problem. Our aim is to estimate progressive surface wear by detecting minute defect development in surface microtopography on Ra 0.7 μm rough stainless steel surfaces subject to mechanical wear from hard particle deposits on a metal bar. The investigation was carried out by using a standard CMOS digital camera with a macro objective. It demonstrates how surface scattering measurements can provide a viable alternative in circumstances where traditional roughness measurement techniques fail to deliver the expected results and, due to certain restraints, laboratory-type surface measurements are not applicable either. Our work is based upon measuring variations in the amount and direction of scattered light, reflected from the inspected surfaces, featuring microirregularities. We will show that it is possible to identify the extent of surface flaws by statistically evaluating the recorded brightness information. The developments in this paper can provide basis for a future quality control system devoted to on-line surface measurements of micro components.

Place, publisher, year, edition, pages
Amsterdam: Elsevier, 2006. 169-172 p.
Keyword [en]
surface roughness, defect assessment, reflectance, light scattering, digital camera
National Category
Production Engineering, Human Work Science and Ergonomics Nano Technology
Research subject
SRA - Production
Identifiers
URN: urn:nbn:se:kth:diva-27703ISBN: 978-0-08-045263-9 (print)ISBN: 0-08-045263-0 (print)OAI: oai:DiVA.org:kth-27703DiVA: diva2:379815
Conference
4M 2006, 20-22 Sept, Grenoble, France
Projects
4M Multi Material Micro Manufacture Network of Excellence
Funder
XPRES - Initiative for excellence in production research
Note
QC 20101220 Available from: 2010-12-20 Created: 2010-12-20 Last updated: 2012-02-29Bibliographically approved
In thesis
1. Light scattering: a tool for measurement of rapid displacements and surface appearance
Open this publication in new window or tab >>Light scattering: a tool for measurement of rapid displacements and surface appearance
2010 (English)Licentiate thesis, comprehensive summary (Other academic)
Place, publisher, year, edition, pages
Stockholm: US-AB, 2010. vi, 55 p.
Series
Trita-IIP, ISSN 1650-1888 ; 2010:04
Keyword
light scattering, reflectance, BRDF, brightness, industrial metrology, optical fiber, optical properties, perception, roughness, surface topography
National Category
Engineering and Technology
Identifiers
urn:nbn:se:kth:diva-27705 (URN)978-91-7415-701-7 (ISBN)
Presentation
2010-08-27, M311, KTH, Brinellvägen 68, Sockholm, 10:00
Opponent
Supervisors
Note
QC 20101220Available from: 2010-12-20 Created: 2010-12-20Bibliographically approved

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