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Light scattering: a tool for measurement of rapid displacements and surface appearance
KTH, School of Industrial Engineering and Management (ITM), Production Engineering.
2010 (English)Licentiate thesis, comprehensive summary (Other academic)
Place, publisher, year, edition, pages
Stockholm: US-AB , 2010. , vi, 55 p.
Series
Trita-IIP, ISSN 1650-1888 ; 2010:04
Keyword [en]
light scattering, reflectance, BRDF, brightness, industrial metrology, optical fiber, optical properties, perception, roughness, surface topography
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:kth:diva-27705ISBN: 978-91-7415-701-7 (print)OAI: oai:DiVA.org:kth-27705DiVA: diva2:379874
Presentation
2010-08-27, M311, KTH, Brinellvägen 68, Sockholm, 10:00
Opponent
Supervisors
Note
QC 20101220Available from: 2010-12-20 Created: 2010-12-20Bibliographically approved
List of papers
1. Fast four-channel fibre-optic displacement sensor for measuring impact waves at low cost
Open this publication in new window or tab >>Fast four-channel fibre-optic displacement sensor for measuring impact waves at low cost
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2006 (English)In: Measurement science and technology, ISSN 0957-0233, E-ISSN 1361-6501, Vol. 17, no 5, 1162-1166 p.Article in journal (Refereed) Published
Abstract [en]

We have developed a fast four-channel fibre-optic sensor for measuring dynamic surface displacements caused by shock waves. Light from an LED emitter is sent through a plastic fibre and reflected from the surface back into the fibre. The intensity of the reflected light gives the distance to the surface unambigously. Based on simple principles and utilizing inexpensive components, micrometre and microsecond resolution is achieved at lower cost and with easier usage than for interferometric methods and with better reliability than an accelerometer. The sensor is comparatively easy to set up. It is battery operated for reduced sensitivity to electromagnetic interference. The design of the fibre probe facilitates access in narrow and hostile environments.

Keyword
Cost, Displacement, Distance, Fibre-optic, Impact waves, Intensity, Plastic fibre
National Category
Production Engineering, Human Work Science and Ergonomics
Identifiers
urn:nbn:se:kth:diva-8965 (URN)10.1088/0957-0233/17/5/S38 (DOI)000238310400039 ()2-s2.0-33646200100 (Scopus ID)
Note
QC 20100914. Conference: 17th International Conference on Optical Fibre Sensors. Brugge, BELGIUM. MAY 23-27, 2005. Available from: 2005-12-27 Created: 2005-12-27 Last updated: 2011-10-04Bibliographically approved
2. Assessment of digital cameras for micro-structural sensing of low contrast surface features
Open this publication in new window or tab >>Assessment of digital cameras for micro-structural sensing of low contrast surface features
2005 (English)In: Proceedings of the First International Conference on Multi-Material Micro Manufacture 2005, Karlsruhe, DE / [ed] Wolfgang Menz and Stefan Dimov, Amsterdam: Elsevier, 2005, 253-257 p.Conference paper, Published paper (Refereed)
Abstract [en]

Evaluation of three digital cameras are presented focusing on their capabilities and applicability in the detection of low-contrast surface features on the micrometer level. The key to a successful identification of surface flaws on microstructured surfaces, such as silicon wafers is the ability to determine minor deviations in the reflectance of an object surface. Micro-topography of a surface, surface structure and surface roughness has a strong influence on the amount and direction of scattered light. Different portions of the surrounding illumination are reflected on different parts of an uneven surface, hence the resulting contrast-variation on the illuminated surface has a strong correlation to the surface structure itself. In our work we discuss the possibilities of using either of the investigated cameras for the automated visual inspection of micro-structured surfaces. The cameras - two of them equipped with CCD and one with CMOS image sensors - are studied in an environment which is similar to standard surface appearance measurements, involving human observers. The specimens, featuring different surface structures are imaged in a well-controlled environment under varying illumination conditions. Experimental results of spatial resolution and contrast sensitivity are presented.

Place, publisher, year, edition, pages
Amsterdam: Elsevier, 2005
Keyword
surface quality, appearance, digital camera, machine vision
National Category
Production Engineering, Human Work Science and Ergonomics Nano Technology
Identifiers
urn:nbn:se:kth:diva-27702 (URN)0-080-44879-8 (ISBN)
Conference
4M 2005, 29 June - 1 July 2005, Karlsruhe, Germany
Projects
4M Multi Material Micro Manufacture Network of Excellence
Note
QC 20101220Available from: 2010-12-20 Created: 2010-12-20 Last updated: 2012-02-29Bibliographically approved
3. Localizing micro-defects on rough metal surfaces
Open this publication in new window or tab >>Localizing micro-defects on rough metal surfaces
2006 (English)In: Proceeding of the 2nd International Conference on Multi-Material Micro Manufacture 2006, Grenoble, FR / [ed] Wolfgang Menz, Stefan Dimov and Bertrand Fillon, Amsterdam: Elsevier, 2006, 169-172 p.Conference paper, Published paper (Refereed)
Abstract [en]

In this paper we present a study of reflectance measurements to a direct metrological problem. Our aim is to estimate progressive surface wear by detecting minute defect development in surface microtopography on Ra 0.7 μm rough stainless steel surfaces subject to mechanical wear from hard particle deposits on a metal bar. The investigation was carried out by using a standard CMOS digital camera with a macro objective. It demonstrates how surface scattering measurements can provide a viable alternative in circumstances where traditional roughness measurement techniques fail to deliver the expected results and, due to certain restraints, laboratory-type surface measurements are not applicable either. Our work is based upon measuring variations in the amount and direction of scattered light, reflected from the inspected surfaces, featuring microirregularities. We will show that it is possible to identify the extent of surface flaws by statistically evaluating the recorded brightness information. The developments in this paper can provide basis for a future quality control system devoted to on-line surface measurements of micro components.

Place, publisher, year, edition, pages
Amsterdam: Elsevier, 2006
Keyword
surface roughness, defect assessment, reflectance, light scattering, digital camera
National Category
Production Engineering, Human Work Science and Ergonomics Nano Technology
Research subject
SRA - Production
Identifiers
urn:nbn:se:kth:diva-27703 (URN)978-0-08-045263-9 (ISBN)0-08-045263-0 (ISBN)
Conference
4M 2006, 20-22 Sept, Grenoble, France
Projects
4M Multi Material Micro Manufacture Network of Excellence
Funder
XPRES - Initiative for excellence in production research
Note
QC 20101220 Available from: 2010-12-20 Created: 2010-12-20 Last updated: 2012-02-29Bibliographically approved

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