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Compact phase-contrast soft X-ray microscopy
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.ORCID iD: 0000-0003-2745-6289
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2009 (English)In: Journal of Physics, Conference Series, ISSN 1742-6588, E-ISSN 1742-6596, Vol. 186Article in journal (Refereed) Published
Abstract [en]

For nearly all elements, the real part, delta, of the complex index of refraction n (n = 1 - delta + i beta) is larger than the imaginary part, beta, in the x-ray region. Since only beta is used in absorption contrast, phase-contrast imaging techniques which give access to delta are very important. In this paper we present two different implementations of phase contrast in our compact soft x-ray microscope, differential-interference contrast and Zemike phase contrast.

Place, publisher, year, edition, pages
2009. Vol. 186
Keyword [en]
DIFFRACTIVE OPTICAL-ELEMENTS, ZONE PLATES
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-29224DOI: 10.1088/1742-6596/186/1/012038ISI: 000282023900038Scopus ID: 2-s2.0-73349114629OAI: oai:DiVA.org:kth-29224DiVA: diva2:392978
Note
QC 20110128Available from: 2011-01-28 Created: 2011-01-27 Last updated: 2017-12-11Bibliographically approved

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Holmberg, AndersHertz, Hans M.Vogt, Ulrich

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von Hofsten, OlovBertilson, MichaelLindblom, MagnusHolmberg, AndersHertz, Hans M.Vogt, Ulrich
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