Compact phase-contrast soft X-ray microscopy
2009 (English)In: Journal of Physics, Conference Series, ISSN 1742-6588, E-ISSN 1742-6596, Vol. 186Article in journal (Refereed) Published
For nearly all elements, the real part, delta, of the complex index of refraction n (n = 1 - delta + i beta) is larger than the imaginary part, beta, in the x-ray region. Since only beta is used in absorption contrast, phase-contrast imaging techniques which give access to delta are very important. In this paper we present two different implementations of phase contrast in our compact soft x-ray microscope, differential-interference contrast and Zemike phase contrast.
Place, publisher, year, edition, pages
2009. Vol. 186
DIFFRACTIVE OPTICAL-ELEMENTS, ZONE PLATES
IdentifiersURN: urn:nbn:se:kth:diva-29224DOI: 10.1088/1742-6596/186/1/012038ISI: 000282023900038ScopusID: 2-s2.0-73349114629OAI: oai:DiVA.org:kth-29224DiVA: diva2:392978
QC 201101282011-01-282011-01-272011-01-28Bibliographically approved