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A bandwidth extension technique for dynamic characterization of power amplifiers
KTH, School of Electrical Engineering (EES), Signal Processing.
KTH, School of Electrical Engineering (EES), Signal Processing. KTH, School of Electrical Engineering (EES), Centres, ACCESS Linnaeus Centre.ORCID iD: 0000-0002-2718-0262
2006 (English)In: 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings, 2006, 1972-1976 p.Conference paper, Published paper (Refereed)
Abstract [en]

In this paper a method for increasing the bandwidth of a test-bed for dynamic characterization of power amplifiers is described. The technique is readily implemented using commercially available instruments which makes it suitable for e.g. production testing The bandwidth extension technique is combined with coherent averaging of the measurements in order to simultaneously increase the bandwidth and dynamic range of the test-bed. In addition the errors in the obtained wideband signal are estimated. The method is evaluated experimentally on a basestation power amplifier for the 3G WCDAM system.

Place, publisher, year, edition, pages
2006. 1972-1976 p.
Series
IEEE instrumentation & measurement technology conference, proceedings, ISSN 1091-5281
Keyword [en]
amplifier model, bandwidth extension, dynamic range, measurement system, power amplifier, test-bed
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-34934DOI: 10.1109/IMTC.2006.236121ISI: 000244176704006Scopus ID: 2-s2.0-34547891139ISBN: 978-0-7803-9359-2 (print)OAI: oai:DiVA.org:kth-34934DiVA: diva2:427740
Conference
23rd IEEE Instrumentation and Measurement Technology Conference Sorrento, ITALY, APR 24-27, 2006
Note
QC 20110628Available from: 2011-06-28 Created: 2011-06-17 Last updated: 2011-11-18Bibliographically approved

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Händel, Peter

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CiteExportLink to record
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Citation style
  • apa
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  • Other locale
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Output format
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